

![]() | Electrically characterizing nano electronic devices and | |
| semiconductor materials via proven methods based on device physics |
![]() | Systematically analyzing electrical parameters to debug device | |
| physical structures and identify integration issues |
![]() | Correlating e-test result to device manufacture processes and | |
| monitoring fab processes using scribe line monitors (SLM) |
![]() | Segmenting the root causes of device performance issues and | |
| proposing fab process or integration fixes. |